| Autor: |
Vasko, A. C., Warrell, G. R., Parsai, E. I., Karpov, V. G., Shvydka, Diana |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2015, Vol. 118 Issue 12, p125301-1-125301-5, 5p, 3 Black and White Photographs, 2 Graphs |
| Abstrakt: |
We have investigated the influence of electron irradiation on tin whisker growth. Sputtered tin samples exposed to electron beam of 6MeV energy exhibited fast whisker growth, while control samples did not grow any whiskers. The statistics of e-beam induced whiskers was found to follow the log-normal distribution. The observed accelerated whisker growth is attributed to electrostatic effects due to charges trapped in an insulating substrate. These results offer promise for establishing whisker-related accelerated life testing protocols. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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