Diamond milling with an Atomic Force Microscope.
| Autor: | Ippolito, Stephen, Zumwalt, Sean, Erickson, Andy |
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| Zdroj: | 2015 IEEE 22nd International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2015, p500-502, 3p |
| Databáze: | Complementary Index |
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