Electrical simulation on the localized NVM failed cell by AFP nanoproing.
| Autor: | Chen, C. Q., Ng, G. B. Ang. P.T., Ng, H. P., Alfred, Q., Huang, Y. M., Mai, Z. H., Lam, Jeffery |
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| Zdroj: | 2015 IEEE 22nd International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2015, p242-245, 4p |
| Databáze: | Complementary Index |
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