PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuits.
| Autor: | Shah, Toral, Matrosova, Anzhela, Singh, Virendra |
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| Zdroj: | 2015 19th International Symposium on VLSI Design & Test; 2015, p1-2, 2p |
| Databáze: | Complementary Index |
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