The Structural Evolution of Pore Formation in Low-k Dielectric Thin Films.

Autor: Silverstein, Michael S., Bauer, Barry J., Hae-Jeong Lee, Barry J., Hedden, Ronald C., Landes, Brian, Lyons, John, Kern, Brandon, Niu, Jason, Kalantar, Tom
Předmět:
Zdroj: AIP Conference Proceedings; 2003, Vol. 683 Issue 1, p572-575, 4p
Abstrakt: Specular x-ray reflectivity and small angle neutron scattering were used to characterize changes in the porosity, pore size and pore size distribution on processing a polymeric low-k material filled with 21.6 volume percent of a deuterated porogen with an average radius of 56 Å. Processing yielded a decrease in porosity to about 11 %, an increase in average pore radius to 83 Å, and a narrower pore size distribution. A sample with an unusual pore structure could be easily identified. © 2003 American Institute of Physics [ABSTRACT FROM AUTHOR]
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