Autor: |
Tayebi, Noureddine, Conry, Thomas F., Polycarpou, Andreas A. |
Předmět: |
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Zdroj: |
Journal of Materials Research; Sep2003, Vol. 18 Issue 9, p2150, 13p, 6 Diagrams, 4 Charts, 9 Graphs |
Abstrakt: |
Presents an extended model of the nanoscratch technique for the estimation of hardness of thin films, with prior consideration on interfacial shear stress and elastic recovery. Overview of various methods for the determination of the mechanical properties of thin films; Procedure for evaluating the effect of elastic recovery of the elastic-plastically deformed surfaces; Relationship between scratch parameters and hardness. |
Databáze: |
Complementary Index |
Externí odkaz: |
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