| Autor: |
Maiberg, Matthias, Hölscher, Torsten, Zahedi-Azad, Setareh, Scheer, Roland |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2015, Vol. 118 Issue 10, p105701-1-105701-10, 10p, 3 Diagrams, 5 Charts, 2 Graphs, 1 Map |
| Abstrakt: |
In the third part of this series, we study the influence of trap states in the band gap of semiconductors on the time-resolved luminescence decay (TRL) after a pulsed excitation. The results based on simulations with Synopsys TCAD® and analytical approximations are given for p-doped Cu(In,Ga)Se2 as a working example. We show that a single trap can be mostly described by two parameters which are assigned to minority carrier capture and emission. We analyze their influence on the luminescence decay and study the difference between a single trap and an energetic Gaussian trap distribution. It is found that trap states artificially increase the TRL decay and obscure the recombination dynamics. Thus, there is a demand for experimental methods which can reveal the recombination of minority carriers in a TRL experiment without trapping effect. In this regard, a variation of the device temperature, the excitation frequency, the injection level, as well as a bias illumination may be promising approaches. We study these methods, discuss advantages and disadvantages, and show experimental TRL for prove of concept. At the end, we validate our approach of simulating only band-to-band radiative recombination although photoluminescence spectra often exhibit free-to-bound radiative recombination of charge carriers. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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