Analysis of fast and slow trap states on electrical performance of AlGaN/GaN HEMTs.

Autor: Kaushik, Janesh K, Balakrishnan, V Raman, Panwar, Brishbhan Singh, Muralidharan, Rangarajan
Zdroj: 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE); 2014, p1-3, 3p
Databáze: Complementary Index