Analysis of fast and slow trap states on electrical performance of AlGaN/GaN HEMTs.
Autor: | Kaushik, Janesh K, Balakrishnan, V Raman, Panwar, Brishbhan Singh, Muralidharan, Rangarajan |
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Zdroj: | 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE); 2014, p1-3, 3p |
Databáze: | Complementary Index |
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