Inspection step modeling for defect source tool identification using defectivity control.

Autor: Chakaroun, Mohamad, Messouci, Rabah, Djeziri, Mohand, Ouladsine, Mustapha, Pinaton, Jacques
Zdroj: 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC); 2015, p173-178, 6p
Databáze: Complementary Index