A study of feed-forward strategies for overlay control in lithography processes using CGS technology.
Autor: | Anberg, Doug, Owen, David M., Lee, Byoung-Ho, Shetty, Shrinivas, Bouche, Eric |
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Zdroj: | 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC); 2015, p395-400, 6p |
Databáze: | Complementary Index |
Externí odkaz: |