Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors.
| Autor: | Hou, Rui, Spirito, Marco, Heeres, Rob, van Rijs, Fred, de Vreede, Leo C.N. |
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| Zdroj: | 2015 IEEE MTT-S International Microwave Symposium; 2015, p1-3, 3p |
| Databáze: | Complementary Index |
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