Impact of device and interconnect process variability on clock distribution.

Autor: Fievet, Nathalie, Raghavan, Praveen, Baert, Rogier, Robert, Frederic, Mercha, Abdelkarim, Verkest, Diederik, Thean, Aaron
Zdroj: 2015 International Conference on IC Design & Technology (ICICDT); 2015, p1-4, 4p
Databáze: Complementary Index