An automatized time-domain set-up for on-wafer charaterization, doherty oriented, of high power GaN HEMTS.
| Autor: | Ayari, L., Ayad, M., Byk, E., Camiade, M., Neveux, G., Barataud, D. |
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| Zdroj: | 2015 85th Microwave Measurement Conference (ARFTG); 2015, p1-4, 4p |
| Databáze: | Complementary Index |
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