A built-in supply current test circuit for electrical interconnect tests of 3D ICs.
| Autor: | Hashizume, Masaki, Umezu, Shoichi, Yotsuyanagi, Hiroyuki, Shyue-Kung Lu |
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| Zdroj: | 2014 International 3D Systems Integration Conference (3DIC); 2014, p1-6, 6p |
| Databáze: | Complementary Index |
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