Surface defect detection in low-contrast images using basis image representation.
| Autor: | Tsai, Du-Ming, Tseng, Yan-Hsin, Chiu, Wei-Yao |
|---|---|
| Zdroj: | 2015 14th IAPR International Conference on Machine Vision Applications (MVA); 2015, p186-189, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|