Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.
| Autor: | Borrel, N., Champeix, C., Lisart, M., Sarafianos, A., Kussener, E., Rahajandraibe, W., Dutertre, J-M. |
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| Zdroj: | 2015 IEEE International Reliability Physics Symposium; 2015, p00-FA.1.6, 0p |
| Databáze: | Complementary Index |
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