Commercialization and reliability of 600 V GaN power switches.

Autor: Kikkawa, Toshihide, Hosoda, Tsutomu, Shono, Ken, Imanishi, Kenji, Asai, Yoshimori, Wu, YiFeng, Shen, Likun, Smith, Kurt, Dunn, Dixie, Chowdhury, Saurabh, Smith, Peter, Gritters, John, McCarthy, Lee, Barr, Ronald, Lal, Rakesh, Mishra, Umesh, Parikh, Primit
Zdroj: 2015 IEEE International Reliability Physics Symposium; 2015, p00-6C.1.6, 0p
Databáze: Complementary Index