Semi-analytical modeling of an eddy current imaging system for the characterization of defects in metallic structures.
| Autor: | Bore, T., Placko, D., Joubert, P.-Y. |
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| Zdroj: | 2015 IEEE Sensors Applications Symposium (SAS); 2015, p1-5, 5p |
| Databáze: | Complementary Index |
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