A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS Performance.
| Autor: | Lo, Roger, Du, Pei-Ying, Hsu, Tzu-Hsuan, Wu, Chen-Jun, Guo, Jung-Yi, Cheng, Chun-Min, Lue, Hang-Ting, Shih, Yen-Hao, Hou, Tuo-Hung, Hsieh, Kuang-Yeu, Lu, Chih-Yuan |
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| Zdroj: | 2015 IEEE International Memory Workshop (IMW); 2015, p1-4, 4p |
| Databáze: | Complementary Index |
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