On-board networks with radiation-hardened 45nm SOI standard components.
| Autor: | Rickard, Dale, Hutcheson, David, Santee, Steven, Pirkl, Dan, Robertson, Jeffrey, Stanley, Daniel, Ross, Jason, Hanley, Mary, Trippe, Daniel, Fleming, Patrick, Livoti, James, Nisar, Ashraf, Robertazzi, Jeannine, Federico, Jacob, Lauper, Bryon, Knowles, Kenneth, Blumen, Arthur, Koehler, Jennifer, Gilliam, Jane, Saari, Brian |
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| Zdroj: | 2015 IEEE Aerospace Conference; 2015, p1-17, 17p |
| Databáze: | Complementary Index |
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