Methods for virtual junction temperature measurement respecting internal semiconductor processes.
| Autor: | Herold, Christian, Franke, Jorg, Bhojani, Riteshkumar, Schleicher, Andre, Lutz, Josef |
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| Zdroj: | 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD); 2015, p325-328, 4p |
| Databáze: | Complementary Index |
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