Stability of silicon carbide Schottky diodes against leakage current thermal runaway.
Autor: | Bodeker, Christian, Vogt, Timo, Kaminski, Nando |
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Zdroj: | 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD); 2015, p245-248, 4p |
Databáze: | Complementary Index |
Externí odkaz: |