Stability of silicon carbide Schottky diodes against leakage current thermal runaway.

Autor: Bodeker, Christian, Vogt, Timo, Kaminski, Nando
Zdroj: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD); 2015, p245-248, 4p
Databáze: Complementary Index