Diagnosing timing related cell internal defects for FinFET technology.
| Autor: | Tang, Huaxing, Tai, Ting-Pu, Cheng, Wu-Tung, Benware, Brady, Hapke, Friedrich |
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| Zdroj: | VLSI Design, Automation & Test(VLSI-DAT); 2015, p1-4, 4p |
| Databáze: | Complementary Index |
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