| Autor: |
Mishina, E. D., Sherstyuk, N. E., Mishina, A. V., Mukhorotov, V. M., Buinutskaya, G., Kulyuk, L. L., Rasing, Th. |
| Předmět: |
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| Zdroj: |
Ferroelectrics; 2003, Vol. 286 Issue 1, p279, 12p |
| Abstrakt: |
A simple nonlinear optical technique is suggested to measure the ratio of in-plane and Z -oriented domains in thin ferroelectric films, which is based on measurements of the SHG intensity as a function of the angle of incidence. From the interference patterns arising from multiple reflections qualitative information about the domain coherence can be obtained, a factor that might be important for electrical properties of the film. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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