| Autor: |
Yi-Chun Chen, W. C., Hsiu-Fung Cheng, W. C., Hsiang-Lin Liu, Chih-Ta Chia, I-Nan Lin |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/1/2003, Vol. 94 Issue 5, p3365, 6p, 1 Diagram, 1 Chart, 5 Graphs |
| Abstrakt: |
The relationship between the microwave dielectric properties and the IR active phonons of xBa(Mg[sub 1/3]Ta[sub 2/3])O[sub 3]–(1-x)Ba(Mg[sub 1/3]Nb[sub 2/3])O[sub 3] ceramics was investigated. The IR modes were assigned, and the origin of dielectric response was determined. Among the 15 prominent IR modes, we found that the normal vibrations of the O layers and that of the Ta/Nb layers are strongly correlated to the measured dispersion parameters, such as the resonant strength (4πρ) and the damping coefficient (γ). The frequency shifts of the normal modes of the O layers and that of the Ta/Nb layers explain the linear decrease of microwave dielectric constant (K) as x increases, while the width of these modes correlate with the Q×f value. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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