Critical temperature depth profiling and improvement of YBa2Cu3O7 weak links produced by ion...
Autor: | Tinchev, S.S. |
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Předmět: | |
Zdroj: | Journal of Applied Physics; 1/1/1997, Vol. 81 Issue 1, p324, 4p, 1 Diagram, 3 Graphs |
Abstrakt: | Discusses the critical temperature depth profiling of a superconductor weak links produced by ion modification. Creation of a channel in the region of the superconducting film; Observed Josephson properties; Reduced connectivity inside the film region. |
Databáze: | Complementary Index |
Externí odkaz: |