Autor: |
Constantinian, Karen Y., Ovsyannikov, Gennady A., Borisenko, Igor V., Mygind, Jesper, Pedersen, Niels F. |
Předmět: |
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Zdroj: |
IEEE Transactions on Applied Superconductivity; Jun2003 Part 1 of 3, Vol. 13 Issue 2, p610, 4p, 1 Chart, 8 Graphs |
Abstrakt: |
We measured spectral noise density in YBCO symmetric bicrystal Josephson junctions on sapphire substrates at bias voltages up to 100 mV and T = 4.2 K. Normal state resistance of the Josephson junctions, R[sub N] = 20-90 Ω and I[sub C]R[sub N] up to 2.2 mV have been observed in the experimental samples. Noise measurements were carried out within frequency bands of 1-2 GHz and 0,3-300 kHz. At bias voltages 10 ≤ V ≤ 60 mV a linear voltage dependence of noise power has been registered, while at V ≤ 5 mV a noticeable noise rise has been observed. The latter may explain the experimentally measured linewidth broadening of Josephson oscillations at mm and submm wave frequencies in high-Tc superconducting junctions. Experimental results are discussed in terms of bound states existing at surfaces of d-wave superconducting electrodes. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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