Location techniques of failure analysis ESD damage in electronic component.

Autor: Lai, Ping, Wang, Youliang, Liang, Xiaosi, Kuang, Xianjun, Zou, Jinlin
Zdroj: 2014 10th International Conference on Reliability, Maintainability & Safety (ICRMS); 2014, p127-131, 5p
Databáze: Complementary Index