Location techniques of failure analysis ESD damage in electronic component.
Autor: | Lai, Ping, Wang, Youliang, Liang, Xiaosi, Kuang, Xianjun, Zou, Jinlin |
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Zdroj: | 2014 10th International Conference on Reliability, Maintainability & Safety (ICRMS); 2014, p127-131, 5p |
Databáze: | Complementary Index |
Externí odkaz: |