Characterization of recessed Ohmic contacts to AlGaN/GaN.
| Autor: | Hajlasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R., Schmitz, J. |
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| Zdroj: | Proceedings of the 2015 International Conference on Microelectronic Test Structures; 2015, p158-162, 5p |
| Databáze: | Complementary Index |
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