Observations on substrate characterisation through Coplanar Transmission Line Impedance measurements.
| Autor: | Floyd, Liam, Pike, John, Tao, Jing, Jackson, Nathan |
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| Zdroj: | Proceedings of the 2015 International Conference on Microelectronic Test Structures; 2015, p224-229, 6p |
| Databáze: | Complementary Index |
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