Transient junction temperature measurements of power MOSFETs in the μs range.
| Autor: | Ebli, Michael, Pfost, Martin, Wendel, Christoph |
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| Zdroj: | 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM); 2015, p267-272, 6p |
| Databáze: | Complementary Index |
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