Nanoindentation Measurements of Cu Films with Different Thicknesses Deposited on a Single Crystalline Si Substrate.
| Autor: | Pyrtsac, Constantin |
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| Zdroj: | Nanoscience Advances in CBRN Agents Detection, Information & Energy Security; 2015, p73-83, 11p |
| Databáze: | Complementary Index |
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