Analog IC test and product engineering curriculum for M.
Autor: | Kamsani, N. A., Sidek, R. M., Yeo, C. W., Gan, D., Quek, C.T., Krishnasamy, S., Lee, Y. M., Bolanos, M. A. |
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Zdroj: | 2014 IEEE International Conference on Teaching, Assessment & Learning for Engineering (TALE); 2014, p283-287, 5p |
Databáze: | Complementary Index |
Externí odkaz: |