Analog IC test and product engineering curriculum for M.

Autor: Kamsani, N. A., Sidek, R. M., Yeo, C. W., Gan, D., Quek, C.T., Krishnasamy, S., Lee, Y. M., Bolanos, M. A.
Zdroj: 2014 IEEE International Conference on Teaching, Assessment & Learning for Engineering (TALE); 2014, p283-287, 5p
Databáze: Complementary Index