An Evaluation of MOS Interface-Trap Charge Pump as an Ultralow Constant-Current Generator.

Autor: Cillingiro&gcaron;lu, U&ucaron;gur, Becker-Gómez, Adriana, Veeder, Kenton T
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Zdroj: IEEE Journal of Solid-State Circuits; Jan2003, Vol. 38 Issue 1, p71, 12p, 1 Black and White Photograph, 7 Diagrams, 26 Graphs
Abstrakt: Examines the MOS interface-trap charge pumps as an ultralow constant-current generator for analog CMOS applications. Suitability of the charge pumping techniques; Model of the terminal characteristics of the interface-trap pump; Creation of transconductor circuits.
Databáze: Complementary Index