A gate delay model focusing on current fluctuation over wide-range of process and environmental variability.
| Autor: | Shinkai, Ken'ichi, Hashimoto, Masanori, Kurokawa, Atsushi, Onoye, Takao |
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| Zdroj: | Proceedings of the 2006 IEEE ACM International Conference Computer-aided Design; 11/5/2006, p47-53, 7p |
| Databáze: | Complementary Index |
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