Estimation of delay test quality and its application to test generation.
| Autor: | Kajihara, Seiji, Morishima, Shohei, Yamamoto, Masahiro, Wen, Xiaoqing, Fukunaga, Masayasu, Hatayama, Kazumi, Aikyo, Takashi |
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| Zdroj: | Proceedings of the 2007 IEEE ACM International Conference Computer-aided Design; 11/5/2007, p413-417, 5p |
| Databáze: | Complementary Index |
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