TID and SEE Characterization of Rad-Hardened 1.2GHz PLL IP from New ST CMOS 65nm Space Technology.
| Autor: | Malou, Florence, Gasiot, Gilles, Chevallier, Remy, Dugoujon, Laurent, Roche, Philippe |
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| Zdroj: | 2014 IEEE Radiation Effects Data Workshop (REDW); 2014, p1-8, 8p |
| Databáze: | Complementary Index |
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