Automated registration of low and high resolution atomic force microscopy images using scale invariant features.
| Autor: | Wang, Yun-feng, Kilpatrick, Jason I, Jarvis, Suzanne P, Boland, Frank, Kokaram, Anil, Corrigan, David |
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| Zdroj: | 2014 IEEE International Conference on Image Processing (ICIP); 2014, p5866-5870, 5p |
| Databáze: | Complementary Index |
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