Wideband characterization of dielectric material by new approaches based on near field microwave microscopy.
| Autor: | Jamal, Rammal, Olivier, Tantot, Nicolas, Delhote, Serge, Verdeyme |
|---|---|
| Zdroj: | 2014 44th European Microwave Conference; 2014, p116-119, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|