Improving microcontroller (MCU) immunity performance to system-level ESD/EFT testing through PCB system co-design methodology.
| Autor: | Murugan, Rajen, Jie Chen, Minhong Mi, Basile, Bart, Jae Park |
|---|---|
| Zdroj: | Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014; 2014, p1-9, 9p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|