A probabilistic analysis of resilient reconfigurable designs.
| Autor: | Malek, A., Tzilis, S., Khan, D. A., Sourdis, I., Smaragdos, G., Strydis, C. |
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| Zdroj: | 2014 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFT); 2014, p141-146, 6p |
| Databáze: | Complementary Index |
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