Zdroj:	Journal of Electronic Testing; Feb2015, Vol. 31 Issue 1, p7-8, 2p
Abstrakt:	People that the author would like to thank for their assistance in reviewing the articles published in this journal are mentioned including Jose Augusto, Kunal Das and Yier Jin.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink