Ground guard structure to reduce the crosstalk noise and electromagnetic interference (EMI) in a vertical probe card for wafer-level testing.
| Autor: | Lee, Eunjung, Lee, Manho, Kim, Jonghoon J., Kim, Mijoo, Kim, Jonghoon, Kim, Joungho, Park, Jeoungkun, Joo, Younghoon, Bang, Yoonhee, Kim, Il, Nam, Seungki |
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| Zdroj: | 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC); 2014, p260-264, 5p |
| Databáze: | Complementary Index |
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