| Autor: |
Svedberg, Erik B., Howard, Kent J., Bønsager, Martin C., Pant, Bharat B., Roy, Anup G., Laughlin, David E. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 7/15/2003, Vol. 94 Issue 2, p993, 8p, 6 Black and White Photographs, 1 Diagram, 1 Chart, 4 Graphs |
| Abstrakt: |
Signal degradation in spin-valve structures is today a concern for long-term stability of data storage devices. One of the possible degradation mechanisms of spin-valve structures in disk drive applications could be thermally activated diffusion between constituent layers. In order to predict and control performance degradation, the interdiffusion coefficients for all bilayers in the spin-valve structure will have to be determined. Here we report results from a Co[sub 90]Fe[sub 10]/Ru interface, common in many spin-valve structures. The diffusion in (0002) oriented polycrystalline Co[sub 90]Fe[sub 10]/Ru multilayers has been measured and quantified by x-ray reflectivity in the temperature range of 450–540 °C. The bulk diffusion in this case is described by an activation energy of E[sub a]=4.95 eV and a prefactor of D[sub 0]=6.43×10[sup -9] m[sup 2]/s. No grain boundary diffusion was detected in the large-grain structure dominated by high symmetry grain boundaries at the temperature interval in this study. For a spin-valve structure that contains Co[sub 90]Fe[sub 10]/Ru interfaces it is clear that with the absence of grain boundary diffusion and a very high activation energy to bulk diffusion degradation will first take place at another interface, or by another phenomenon. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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