EDA solutions to new-defect detection in advanced process technologies.
| Autor: | Marinissen, Erik Jan, Vandling, Gilbert, Goel, Sandeep Kumar, Hapke, Friedrich, Rivers, Jason, Mittermaier, Nikolaus, Bahl, Swapnil |
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| Zdroj: | Proceedings of the Conference: Design, Automation & Test in Europe; 3/12/2012, p123-128, 6p |
| Databáze: | Complementary Index |
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