Test cost reduction for SoC using a combined approach to test data compression and test scheduling.
| Autor: | Zhou, Quming, Balakrishnan, Kedarnath J. |
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| Zdroj: | Proceedings of the Conference: Design, Automation & Test in Europe; 4/16/2007, p39-44, 6p |
| Databáze: | Complementary Index |
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