| Autor: |
Zientek, John, Maj, Jozef, Navrotski, Gary, Srajer, George, Harmata, Charles, Maj, Lech, Lazarski, Krzysztof, Mikula, Stanislaw |
| Předmět: |
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| Zdroj: |
Synchrotron Radiation News; Jan/Feb2015, Vol. 28 Issue 1, p26-33, 8p |
| Abstrakt: |
The mission of the X-ray Characterization Laboratory in the X-ray Science Division (XSD) at the Advanced Photon Source (APS) is to support both the users and the Optics Fabrication Facility that produces high-performance optics for synchrotron X-ray beamlines. The Topography Test Unit (TTU) in the X-ray Lab has been successfully used to characterize diffracting crystals and test monochromators by quantifying residual surface stresses. This topographic method has also been adapted for testing standard X-ray mirrors, characterizing concave crystal optics and, in principle, can be used to visualize residual stresses on any optic made from single crystalline material. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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