| Autor: |
Paluskar, P. V., Kant, C. H., Kohlhepp, J. T., Filip, A. T., Swagten, H. J. M., Koopmans, B., de Jonge, W. J. M. |
| Zdroj: |
Journal of Applied Physics; 5/15/2005, Vol. 97 Issue 10, p10C925-1-10C925-3, 3p, 4 Graphs |
| Abstrakt: |
We examine the role of Mn diffusion in the thermal stability of tunneling spin polarization P by directly measuring P of Al/AlOx /Co/FeMn and Al/AlOx/Co90Fe10 /FeMn junctions using superconducting tunneling spectroscopy sSTSd. We confirm Mn diffusion in our junctions using x-ray photoelectron spectroscopy after an ultrahigh vacuum 500 °C anneal. Surprisingly, and in contrast to the current belief, no drop in P is observed using STS. Therefore, though Mn diffuses significantly, it cannot be solely responsible for the drop in tunneling magnetoresistance observed after postdeposition anneals above 300 °C. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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