| Autor: |
Novikova, Natalia N., Zheludeva, Svetlana I., Konovalov, Oleg V., Kovalchuk, Mikhail V., Stepina, Nina D., Myagkov, Igor V., Godovsky, Yulij K., Makarova, Nina N., Yu. Tereschenko, Elena, Yanusova, Ludmila G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Crystallography; Jun2003 Part 1, Vol. 36 Issue 3-1, p727, 5p |
| Abstrakt: |
Reports on the application of X-ray total external reflection fluorescence to detect an angular dependence of fluorescence yield modulated by evanescent/X-ray standing wave pattern from metal-rich organic monolayer alone on water surface. Determination of electric field intensity in a molecular monolayer. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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