| Autor: |
Gibson, Bridget, Carter, Simon, Fisher, Andy S., Lancaster, S., Marshalle, John, Whiteside, Ian |
| Předmět: |
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| Zdroj: |
JAAS (Journal of Analytical Atomic Spectrometry); 2014, Vol. 29 Issue 11, p1969-2021, 53p |
| Abstrakt: |
The article presents a review that covers developments in the analysis of chemicals, metals and functional materials. Topics discussed include the use of chemometrics for removing substrate interferences, advances in the analysis of nanomaterials and single particles, and the importance of depth profiling of semiconductor materials. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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